Flexible Electronics News

Infinitesima to Commercialize New Methods for Semiconductor Device Characterization

The addition of tomographic capability builds on RPM technology that has broken new ground in taking AFM from Lab to Fab with launch of the Metron3D.

Author Image

By: DAVID SAVASTANO

Editor, Ink World Magazine

The addition of tomographic capability builds on RPM technology that has broken new ground in taking AFM from Lab to Fab with launch of the Metron3D. The RPM, a unique type of Atomic Force Microscope (AFM), has demonstrated disruptive potential, being used in the Metron3D metrology system to deliver in-line imaging at up to 100x the speed of conventional AFM. Using existing features of the design in new ways has enabled further innovation, providing 3D tomographic capability for semiconduc...

Continue reading this story and get 24/7 access to Ink World magazine for FREE


Already a subscriber? Sign in

Keep Up With Our Content. Subscribe To Ink World magazine Newsletters